发明名称 SEMICONDUCTOR MANUFACTURING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a device for etching a layer or sputter-depositing a layer for improving the uniformity. <P>SOLUTION: In a plasma deposition device for depositing a sputtered target material on a substrate, capacitance in an impedance-matching box for an RF coil is varied during the deposition process in such a manner that heating of the RF coil and the substrate and the film deposition become more uniform according to "time-averaging" of the RF voltage distribution along the RF coil. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009057639(A) 申请公布日期 2009.03.19
申请号 JP20080286640 申请日期 2008.11.07
申请人 APPLIED MATERIALS INC 发明人 VAN GOGH JAMES;FORSTER JOHN C
分类号 C23C14/34;H05H1/46;C23C14/54;H01F29/10;H01J37/32;H01L21/203;H01L21/302;H01L21/3065;H05H1/24 主分类号 C23C14/34
代理机构 代理人
主权项
地址