发明名称 |
SEMICONDUCTOR MANUFACTURING DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a device for etching a layer or sputter-depositing a layer for improving the uniformity. <P>SOLUTION: In a plasma deposition device for depositing a sputtered target material on a substrate, capacitance in an impedance-matching box for an RF coil is varied during the deposition process in such a manner that heating of the RF coil and the substrate and the film deposition become more uniform according to "time-averaging" of the RF voltage distribution along the RF coil. <P>COPYRIGHT: (C)2009,JPO&INPIT |
申请公布号 |
JP2009057639(A) |
申请公布日期 |
2009.03.19 |
申请号 |
JP20080286640 |
申请日期 |
2008.11.07 |
申请人 |
APPLIED MATERIALS INC |
发明人 |
VAN GOGH JAMES;FORSTER JOHN C |
分类号 |
C23C14/34;H05H1/46;C23C14/54;H01F29/10;H01J37/32;H01L21/203;H01L21/302;H01L21/3065;H05H1/24 |
主分类号 |
C23C14/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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