发明名称 Stress release layout and associated methods and devices
摘要 An embodiment semiconductor device includes a substrate such as a silicon or silicon-containing film, a pixel array supported by the substrate, and a metal stress release feature arranged around a periphery of the pixel array. The metal stress release feature may be formed from metal strips or discrete metal elements. The metal stress release feature may be arranged in a stress release pattern that uses a single line or a plurality of lines. The metal stress release pattern may also use metal corner elements at ends of the lines.
申请公布号 US9478578(B2) 申请公布日期 2016.10.25
申请号 US201514923148 申请日期 2015.10.26
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Jeng Chi-Cherng;Chou Chun-Hao;Tsai Tsung-Han;Lee Kuo-Cheng;Chien Volume;Ho Yen-Hsung;Tseng Allen
分类号 H01L27/146;H01L31/18 主分类号 H01L27/146
代理机构 Slater Matsil, LLP 代理人 Slater Matsil, LLP
主权项 1. A semiconductor device, comprising: a substrate, the substrate having a device region and a periphery region; one or more metal stress release features on the periphery region of the substrate; and an interlayer dielectric layer over the device region and the one or more metal stress release features, the interlayer dielectric layer being a lowermost interlayer dielectric layer.
地址 Hsin-Chu TW