发明名称 Semiconductor device and method of fabricating the same
摘要 A semiconductor device and a method of fabricating the same are disclosed. The semiconductor device includes: a memory cell structure formed over a semiconductor substrate; a channel portion formed in the semiconductor substrate; a through-hole formed to pass through the memory cell structure; a first channel region formed over sidewalls of the through-hole; and a second channel region formed at a center part of the through-hole, and spaced apart from the first channel region, wherein each of the first channel region and the second channel region is coupled to the channel portion.
申请公布号 US9478559(B2) 申请公布日期 2016.10.25
申请号 US201514694829 申请日期 2015.04.23
申请人 SK Hynix Inc. 发明人 Jeon Jae Eun;Oh Sung Lae
分类号 H01L29/00;H01L27/115 主分类号 H01L29/00
代理机构 IP & T Group LLP 代理人 IP & T Group LLP
主权项 1. A semiconductor device comprising: a memory cell structure formed over a semiconductor substrate; a channel connector formed in the semiconductor substrate; a through-hole formed to pass through the memory cell structure; a first channel region formed over sidewalls of the through-hole; and a second channel region formed at a center part of the through-hole and isolated from the first channel region by an insulation film in the through-hole, wherein the first channel region and the second channel region are indirectly connected to each other through the channel connector.
地址 Gyeonggi-do KR