发明名称 |
Semiconductor device and method of fabricating the same |
摘要 |
A semiconductor device and a method of fabricating the same are disclosed. The semiconductor device includes: a memory cell structure formed over a semiconductor substrate; a channel portion formed in the semiconductor substrate; a through-hole formed to pass through the memory cell structure; a first channel region formed over sidewalls of the through-hole; and a second channel region formed at a center part of the through-hole, and spaced apart from the first channel region, wherein each of the first channel region and the second channel region is coupled to the channel portion. |
申请公布号 |
US9478559(B2) |
申请公布日期 |
2016.10.25 |
申请号 |
US201514694829 |
申请日期 |
2015.04.23 |
申请人 |
SK Hynix Inc. |
发明人 |
Jeon Jae Eun;Oh Sung Lae |
分类号 |
H01L29/00;H01L27/115 |
主分类号 |
H01L29/00 |
代理机构 |
IP & T Group LLP |
代理人 |
IP & T Group LLP |
主权项 |
1. A semiconductor device comprising:
a memory cell structure formed over a semiconductor substrate; a channel connector formed in the semiconductor substrate; a through-hole formed to pass through the memory cell structure; a first channel region formed over sidewalls of the through-hole; and a second channel region formed at a center part of the through-hole and isolated from the first channel region by an insulation film in the through-hole, wherein the first channel region and the second channel region are indirectly connected to each other through the channel connector. |
地址 |
Gyeonggi-do KR |