发明名称 |
Cross-point memory device including multi-level cells and operating method thereof |
摘要 |
A method of operating a cross-point memory device, having an array of multilevel cells, includes performing a first reading operation with respect to the multilevel cells through a plurality of sensing operations to determine a first state and performing a second reading operation with respect to the multilevel cells through a plurality of sensing operations to determine a second state. A difference between a level of a first voltage used in a first sensing operation and a level of a second voltage used in a second sensing operation in the first reading operation is different from a difference between a level of a third voltage used in a first sensing operation and a level of a fourth voltage used in a second sensing operation in the second reading operation. |
申请公布号 |
US9478285(B2) |
申请公布日期 |
2016.10.25 |
申请号 |
US201514800060 |
申请日期 |
2015.07.15 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Park Hyun-Kook;Yoon Chi-Weon;Byeon Dae-Seok |
分类号 |
G11C11/00;G11C13/00;G11C11/56;G11C11/16 |
主分类号 |
G11C11/00 |
代理机构 |
Volentine & Whitt, PLLC |
代理人 |
Volentine & Whitt, PLLC |
主权项 |
1. A method of operating a cross-point memory device comprising a memory cell array comprising multilevel cells, the method comprising:
performing a first reading operation with respect to the multilevel cells through a plurality of sensing operations to determine a first state; and performing a second reading operation with respect to the multilevel cells through a plurality of sensing operations to determine a second state, wherein a difference between a level of a first voltage used in a first sensing operation and a level of a second voltage used in a second sensing operation in the first reading operation is different from a difference between a level of a third voltage used in a first sensing operation and a level of a fourth voltage used in a second sensing operation in the second reading operation. |
地址 |
Suwon-si, Gyeonggi-do KR |