发明名称 |
PROCESS FOR MANUFACTURING SILICON BORON NITRIDE LAYERS FOR INTEGRATED SEMICONDUCTOR CIRCUITS |
摘要 |
Silicon boron nitride layers, which can be used as intermetallisation and/or final passivation layers, are prepared by chemical vapour deposition in an electromagnetic alternating field using liquid starting compounds which already contain in molecular terms some of the target composition of the silicon boron nitride layer to be prepared. The silicon boron nitride layers prepared in this way have a permittivity epsilon whose value is less than 4� epsilon 0 and are notable for good insulation and barrier properties and a high breakdown strength. �<IMAGE>� |
申请公布号 |
EP0355366(A3) |
申请公布日期 |
1991.03.13 |
申请号 |
EP19890112677 |
申请日期 |
1989.07.11 |
申请人 |
SIEMENS AKTIENGESELLSCHAFT |
发明人 |
TREICHEL, HELMUTH;SPINDLER, OSWALD, DR.;NEUREITHER, BERNHARD |
分类号 |
C23C16/30;C23C16/44;H01L21/31;H01L21/316;H01L21/56;H01L23/29;(IPC1-7):H01L21/318;C23C16/34 |
主分类号 |
C23C16/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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