发明名称 半導体装置
摘要 A semiconductor device, that has a transistor region and a surge-protector region, includes: a substrate; a first semiconductor layer formed on the substrate; a second semiconductor layer formed on the first semiconductor layer; a gate electrode, a source electrode, and a drain electrode formed on the second semiconductor layer in the transistor region; and a surge-protector first electrode, a surge-protector second electrode, and a surge-protector third electrode formed on the second semiconductor layer in the surge-protector region, wherein the source electrode and the surge-protector second electrode are connected to each other, wherein the drain electrode and the surge-protector third electrode are connected to each other, wherein the surge-protector first electrode is formed between the surge-protector second electrode and the surge-protector third electrode, and wherein a distance between the surge-protector first electrode and the surge-protector third electrode is smaller than a distance between the gate electrode and the drain electrode.
申请公布号 JP5935425(B2) 申请公布日期 2016.06.15
申请号 JP20120062902 申请日期 2012.03.19
申请人 富士通株式会社 发明人 今田 忠紘
分类号 H01L21/337;H01L21/28;H01L21/338;H01L21/822;H01L27/04;H01L27/095;H01L29/417;H01L29/778;H01L29/808;H01L29/812 主分类号 H01L21/337
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