发明名称 |
Double layered transparent conductive oxide for reduced schottky barrier in photovoltaic devices |
摘要 |
A device and method for fabricating a photovoltaic device includes forming a double layer transparent conductive oxide on a transparent substrate. The double layer transparent conductive oxide includes forming a doped electrode layer on the substrate, and forming a buffer layer on the doped electrode layer. The buffer layer includes an undoped or p-type doped intrinsic form of a same material as the doped electrode layer. A light-absorbing semiconductor structure includes a p-type semiconductor layer on the buffer layer, an intrinsic layer and an n-type semiconductor layer. |
申请公布号 |
US9379259(B2) |
申请公布日期 |
2016.06.28 |
申请号 |
US201213668941 |
申请日期 |
2012.11.05 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION;BAY ZU PRECISION CO., LTD. |
发明人 |
Chen Shun-Ming;Huang Chien-Chih;Desouza Joel P.;Hong Augustin J.;Kim Jeehwan;Ku Chien-Yeh;Sadana Devendra K.;Wang Chuan-Wen |
分类号 |
H01L31/075;H01L31/0224;H01L31/0392;H01L31/18 |
主分类号 |
H01L31/075 |
代理机构 |
Tutunjian & Bitetto, P.C. |
代理人 |
Tutunjian & Bitetto, P.C. ;Percello Louis J. |
主权项 |
1. A method for fabricating a photovoltaic device, comprising:
forming a double layer transparent conductive oxide on a transparent substrate including:
forming a doped electrode layer on the substrate; andforming a buffer layer on the doped electrode layer by reducing dopant concentration to zero, the buffer layer including an oppositely doped form of a same material as the doped electrode layer, wherein the buffer layer includes a different doping concentration than the doped electrode layer; and forming a light-absorbing semiconductor structure including a p-type semiconductor layer on the buffer layer, an intrinsic layer and an n-type semiconductor layer, wherein the buffer layer includes a same material as the doped electrode layer, but is formed by a different processing method, such that a difference in work function between the doped electrode layer and the p-type semiconductor layer is reduced. |
地址 |
Armonk NY US |