发明名称 ANALYTICAL DEVICE
摘要 In this analytical device, each time a mass spectrum data is to be obtained, a mass calibration unit (42) uses a position of peak occurrence, which originates from an internal standard substance of known m/z value, to determine a mass offset quantity, and carries out a process for correcting the mass offset quantity. A mass calibration information collection unit (43) collects the mass offset quantity and the mass correction quantity for each mass spectrum data. After the end of the measurements, a three-dimensional representation information preparation unit (44) creates a three-dimensional graph wherein a multitude of collected mass correction quantities are disposed as plot points in a three-dimensional space comprising as two perpendicular axes a primary column retention time and a secondary column retention time from a comprehensive two-dimensional LC unit (1), and a mass correction quantity as a perpendicular axis to these two axes. In this manner, the relationship between the mass offset quantity and the retention time from each column having a different separation property can be found at a glance, for instance, allowing such a situation in which a mass offset quantity has abnormally increased during execution of measurements to be caught readily.
申请公布号 WO2016103388(A1) 申请公布日期 2016.06.30
申请号 WO2014JP84281 申请日期 2014.12.25
申请人 SHIMADZU CORPORATION 发明人 YAMAGUCHI, SHINICHI;UMEMURA, YOSHIKATSU;IKEGAMI, MASAHIRO;TANAKA, KOJI
分类号 H01J49/40 主分类号 H01J49/40
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