发明名称 |
Method of manufacturing a semiconductor device by forming a film on a substrate |
摘要 |
Provided is a technique of forming a film on a substrate by performing a cycle a predetermined number of times. The cycle includes: forming a first layer by supplying a gas containing a first element to the substrate, wherein the first layer is a discontinuous layer, a continuous layer, or a layer in which at least one of the discontinuous layer or the continuous layer is overlapped; forming a second layer including the first layer and a discontinuous layer including a second element stacked on the first layer; forming a third layer including the second layer and a discontinuous layer including a third element stacked on the second layer; and forming a fourth layer including the first element, the second element, the third element and a fourth element by supplying a gas containing the fourth element to the substrate to modify the third layer. |
申请公布号 |
US9384968(B2) |
申请公布日期 |
2016.07.05 |
申请号 |
US201514679090 |
申请日期 |
2015.04.06 |
申请人 |
Hitachi Kokusai Electric Inc. |
发明人 |
Takasawa Yushin;Karasawa Hajime;Hirose Yoshiro |
分类号 |
H01L21/02;C23C16/455;H01L21/314;H01L21/318;C23C16/46;C23C16/52;C23C16/50;C23C14/54;C23C28/00 |
主分类号 |
H01L21/02 |
代理机构 |
Brundidge & Stanger, P.C. |
代理人 |
Brundidge & Stanger, P.C. |
主权项 |
1. A method of manufacturing a semiconductor device, comprising:
forming a film on a substrate, the film including a first element, a second element different from the first element, a third element different from the second element, and a fourth element different from the first element and the third element, by performing a cycle a predetermined number of times, the cycle including:
(a) forming a first layer that includes the first element by supplying a first gas that includes the first element to the substrate, wherein the first layer includes at least one of: a first discontinuous layer, a continuous layer, or a layer in which at least one of the first discontinuous layer or the continuous layer is overlapped,(b) forming a second layer that includes the first layer and a second discontinuous layer that includes the second element stacked on the first layer, wherein the second discontinuous layer is formed by supplying a second gas that includes the second element to the substrate,(c) forming a third layer that includes the second layer and a third discontinuous layer that includes the third element stacked on the second layer, wherein the third discontinuous layer is formed by supplying a third gas that includes the third element to the substrate, and(d) forming a fourth layer that includes the first element, the second element, the third element and the fourth element by supplying a fourth gas that includes the fourth element to the substrate to modify the third layer under a condition that a modifying reaction of the third layer by the fourth gas is not saturated. |
地址 |
Tokyo JP |