发明名称 発光分光分析による偏析評価方法および偏析評価装置
摘要 PROBLEM TO BE SOLVED: To provide a segregation evaluation method and a segregation evaluation device by emission spectrometric analysis capable of quickly and quantitatively evaluating the degree of segregation of C or a low concentration element of 0.01 wt% or less which is difficult to evaluate by an EPMA (Electron Probe Micro Analyzer) method.SOLUTION: There is provided a method for quantitatively evaluating segregation by performing the concentration mapping analysis of a segregation element by the spark discharge emission spectrometric analysis of a region including a portion to be evaluated on segregation while allowing steel materials including the portion to be evaluated on segregation to continuously scan with respect to an electrode which generates spark discharge, in which scanning is repeatedly performed two or more times on the same scanning line, and at least one of discharge energy and a scanning speed is changed in preliminary scanning and main scanning for quantitative analysis. Thus, it is possible to quickly and quantitatively evaluate the degree of segregation of C or a low concentration element of 0.01 wt% or less which is difficult to evaluate by the EPMA method.
申请公布号 JP5974696(B2) 申请公布日期 2016.08.23
申请号 JP20120157831 申请日期 2012.07.13
申请人 JFEスチール株式会社 发明人 臼井 幸夫
分类号 G01N21/67 主分类号 G01N21/67
代理机构 代理人
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