发明名称 GENERATION OF INSPECTION SERIES
摘要 PURPOSE:To obtain the high trouble detecting rate by storing the circuit state as prohibition state when the generation of the inspection series of the circuit state fails and obtain the inspection series so as not to accord with the prohibition state when the inspection series for other generacy trouble is generat ed. CONSTITUTION:Since '1' can not be set simultaneously at each D flip-flop (DFF) 407, 408, a prohibition state is memorized when the inspection series of 0 degeneracy trouble in the signal line which communicates to an AND gate 411 can not be generated. When the inspection series of 1 degeneracy trouble 416 is obtained, '0' is allotted to an outside input pin 405, and a trouble 416 is excited, and in order to propagate the result to an outside output pin 406, a DFF 407 and two-input OR gate 413 are desired to be set to '1' so that the gate input 411 free from the trouble signal obtains '1', and if '1' is allotted to the DEF 407, '1' can not be allotted to a DFF 408, because of the prohibition state. Accordingly, '1' is allotted to a DFF 409, and the DFF 497 and 409 are put into '1' circuit state, and '1' is applied to the pin 405, and the trouble 416 is excited, an propagated to the pin 406.
申请公布号 JPH0587885(A) 申请公布日期 1993.04.06
申请号 JP19910250883 申请日期 1991.09.30
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 HOSOKAWA TOSHINORI;MOTOHARA AKIRA;OTA MITSUHO
分类号 G01R31/3183;G06F11/22;G06F11/26;G06F17/50 主分类号 G01R31/3183
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