SYSTEM AND METHOD FOR ARITHMETIC OPERATIONS FOR ELECTRONIC PACKAGE INSPECTION

摘要

An inspection system and method uses a first illumination apparatus to illuminate one or more features. Once the object being inspected is illuminated, a first reflected image of the features is captured by an illumination detection device (420). The image is then stored (430). The object being inspected is then illuminated by at least one additional illumination apparatus (440). Each additional illumination apparatus is selected so that it differs from other illumination apparatuses in either geometrical arrangement, degree of diffusion or illumination characteristic. An additional reflected image is then captured by each additional illumination apparatus (450). Each additional reflected image is then stored (460). Once at least two reflected images are captured and stored, they are combined by an image processor using at least one arithmetic operation to create a resulting image in which at least one selected feature is enhanced (470). The enhanced features appearing on the resulting image can then be inspected using additional image processing equipment using standard image analysis techniques.