发明名称 POSITIVE RESIST COMPOSITION
摘要 PROBLEM TO BE SOLVED: To provide a positive electron beam or X-ray resist composition having high sensitivity and high resolving power, ensuring diminished development defects and excellent also in suitability to coating (intrasurface uniformity). SOLUTION: The positive electron beam or X-ray resist composition contains (a) a compound which generates an acid when irradiated with electron beams or X-rays, (b) an alkali-soluble resin containing specified structural units and (c) a compound having a cationic polymerizing function.
申请公布号 JP2002328474(A) 申请公布日期 2002.11.15
申请号 JP20010135262 申请日期 2001.05.02
申请人 FUJI PHOTO FILM CO LTD 发明人 ADEGAWA YUTAKA;UENISHI KAZUYA
分类号 G03F7/039;C08K5/00;C08L25/18;C08L33/14;C08L33/26;C08L101/06;G03F7/004;H01L21/027 主分类号 G03F7/039
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