发明名称 |
POSITIVE RESIST COMPOSITION |
摘要 |
PROBLEM TO BE SOLVED: To provide a positive electron beam or X-ray resist composition having high sensitivity and high resolving power, ensuring diminished development defects and excellent also in suitability to coating (intrasurface uniformity). SOLUTION: The positive electron beam or X-ray resist composition contains (a) a compound which generates an acid when irradiated with electron beams or X-rays, (b) an alkali-soluble resin containing specified structural units and (c) a compound having a cationic polymerizing function. |
申请公布号 |
JP2002328474(A) |
申请公布日期 |
2002.11.15 |
申请号 |
JP20010135262 |
申请日期 |
2001.05.02 |
申请人 |
FUJI PHOTO FILM CO LTD |
发明人 |
ADEGAWA YUTAKA;UENISHI KAZUYA |
分类号 |
G03F7/039;C08K5/00;C08L25/18;C08L33/14;C08L33/26;C08L101/06;G03F7/004;H01L21/027 |
主分类号 |
G03F7/039 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|