发明名称 PHASE-CHANGE MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 <p>In a semiconductor memory device and a method of manufacturing the same, an insulating layer is formed on a substrate having a logic region on which a first pad is provided and a cell region on which a second pad and a lower electrode are subsequently provided. The insulating layer is etched to be a first insulating layer pattern having a first opening exposing the first pad. A first plug is formed in the first opening. The first insulating layer pattern where the first plug is formed is etched to be a second insulating layer pattern having a second opening exposing the lower electrode. A second plug including a phase-changeable material is formed in the second opening. A conductive wire and an upper electrode are formed on the first plug and the second plug, respectively.</p>
申请公布号 KR100711517(B1) 申请公布日期 2007.04.19
申请号 KR20060033239 申请日期 2006.04.12
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SHIN, HEE JU;SHIN, JONG CHAN;PARK, SOON OH;AN, HYEONG GEUN;KO, HAN BONG
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
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