发明名称 POSITIVE RESIST COMPOSITION AND RESIST PATTERN FORMING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a positive resist composition which is superior in resolution, and to provide a resist pattern forming method. <P>SOLUTION: The positive resist composition contains a resin component (A), whose solubility in an alkali developer increases by acidic action and an acid generator component (B) which generates an acid upon exposure to light, wherein the component (A) contains a constitutional unit (a1), derived from a hydroxystyrene and a constitutional unit (a2) having an acetal type acid-dissociable dissolution inhibiting group, and the component (B) contains an acid generator (B1), comprising a compound represented by a cation having a 9-phenylthiocarbazole structure. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008309888(A) 申请公布日期 2008.12.25
申请号 JP20070155421 申请日期 2007.06.12
申请人 TOKYO OHKA KOGYO CO LTD 发明人 MIMURA TAKEYOSHI;SUZUKI TAKAKO
分类号 G03F7/039;C08F212/14;G03F7/004;H01L21/027 主分类号 G03F7/039
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