发明名称 |
Top-side contact structure and fabrication method thereof |
摘要 |
A top-side contact structure is provided. The top-side contact structure includes a substrate. The substrate includes a first semiconductor layer, an insulating layer on the first semiconductor layer, and a second semiconductor layer on the insulating layer. The top-side contact structure also includes a first trench and a second trench formed in the second semiconductor layer and respectively extending along a first direction and a second direction. The first trench and the second trench connect to each other at an intersection point. The top-side contact structure also includes an insulating material filling the first trench and the second trench. The top-side contact structure also includes a contact plug formed at the intersection point and directly contacting the first semiconductor layer. A method for fabricating a top-side contact structure is also provided. |
申请公布号 |
US9391139(B1) |
申请公布日期 |
2016.07.12 |
申请号 |
US201514862321 |
申请日期 |
2015.09.23 |
申请人 |
Vanguard International Semiconductor Corporation |
发明人 |
Chang Hsiung-Shih;Chang Jui-Chun;Chen Li-Che |
分类号 |
H01L21/76;H01L29/06;H01L23/48;H01L21/762;H01L21/768;H01L21/311 |
主分类号 |
H01L21/76 |
代理机构 |
Birch, Stewart, Kolasch & Birch, LLP |
代理人 |
Birch, Stewart, Kolasch & Birch, LLP |
主权项 |
1. A top-side contact structure, comprising:
a substrate comprising a first semiconductor layer, an insulating layer on the first semiconductor layer, and a second semiconductor layer on the insulating layer; a first trench formed in the second semiconductor layer and extending along a first direction; a second trench formed in the second semiconductor layer and extending along a second direction, wherein the first trench and the second trench connect to each other at an intersection point; an insulating material filling the first trench and the second trench; and a contact plug formed at the intersection point and directly contacting the first semiconductor layer. |
地址 |
Hsinchu TW |