发明名称 Top-side contact structure and fabrication method thereof
摘要 A top-side contact structure is provided. The top-side contact structure includes a substrate. The substrate includes a first semiconductor layer, an insulating layer on the first semiconductor layer, and a second semiconductor layer on the insulating layer. The top-side contact structure also includes a first trench and a second trench formed in the second semiconductor layer and respectively extending along a first direction and a second direction. The first trench and the second trench connect to each other at an intersection point. The top-side contact structure also includes an insulating material filling the first trench and the second trench. The top-side contact structure also includes a contact plug formed at the intersection point and directly contacting the first semiconductor layer. A method for fabricating a top-side contact structure is also provided.
申请公布号 US9391139(B1) 申请公布日期 2016.07.12
申请号 US201514862321 申请日期 2015.09.23
申请人 Vanguard International Semiconductor Corporation 发明人 Chang Hsiung-Shih;Chang Jui-Chun;Chen Li-Che
分类号 H01L21/76;H01L29/06;H01L23/48;H01L21/762;H01L21/768;H01L21/311 主分类号 H01L21/76
代理机构 Birch, Stewart, Kolasch & Birch, LLP 代理人 Birch, Stewart, Kolasch & Birch, LLP
主权项 1. A top-side contact structure, comprising: a substrate comprising a first semiconductor layer, an insulating layer on the first semiconductor layer, and a second semiconductor layer on the insulating layer; a first trench formed in the second semiconductor layer and extending along a first direction; a second trench formed in the second semiconductor layer and extending along a second direction, wherein the first trench and the second trench connect to each other at an intersection point; an insulating material filling the first trench and the second trench; and a contact plug formed at the intersection point and directly contacting the first semiconductor layer.
地址 Hsinchu TW
您可能感兴趣的专利