发明名称 Test generation service
摘要 Systems and methods are described for testing computing resources. In one embodiment, a request is received for testing a computing configuration. A set of computing settings that can be implemented on one or more computing devices is searched. An initial test population for testing the computing configuration is determined. The initial test population is iteratively updated based on test results and a fitness function.
申请公布号 US9444717(B1) 申请公布日期 2016.09.13
申请号 US201313781347 申请日期 2013.02.28
申请人 Amazon Technologies, Inc. 发明人 Aithal Anirudh Balachandra;Marr Michael David
分类号 G06F15/177;H04L12/26 主分类号 G06F15/177
代理机构 Baker & Hostetler LLP 代理人 Baker & Hostetler LLP
主权项 1. A computing system comprising: at least one computing device; and at least one memory in communication with the at least one computing device, the at least one memory having stored therein computer instructions that, upon execution by the computing system, at least cause the computing system to: receive a request to test a computing parameter in a computing environment comprising a plurality of computing resources; in response to the request, search information comprising settings that can be controlled on the computing resources in the computing environment, said searching based on metadata indicative of relationships between the settings and corresponding weighted performance metrics, wherein, for at least a first performance metric and at least a first setting, a weight for the first performance metric is indicative of a relevance of the first setting to the first performance metric, and wherein meeting of the first performance metric by testing verifies that the first setting provides functionality associated with the first setting; and based on the searching, generate a test population that verifies the computing parameter in accordance with a set of constraints for bounding a cost associated with the test population.
地址 Seattle WA US