| 主权项 |
1. A method of testing a device, the method comprising:
determining a computational window, wherein the computational window is a time period of device testing activity below an activity threshold of a test apparatus, wherein at least one computational window occurs during the device testing activity, wherein the test apparatus is connected to a prober and handler; and creating and executing a decision tree during the computational window, wherein the decision tree comprises a scheduled test analysis of test results and a selection of test control actions scheduled to execute in response to the test analysis, wherein the computational window is defined by a beginning time and an ending time, and wherein the computational window further defines when scheduling and execution of the decision tree is stopped, delayed or synchronized. |
