发明名称 Semiconductor device and a method for the manufacture thereof
摘要 In diodes used with high withstand voltages, the pin-type diode has a low on-resistance, but a large switching loss. Even if a lifetime killer is introduced, the low on-resistance and the switching loss cannot be compatible since both factors are in a trade-off relation. The invention overcomes these problems by providing a semiconductor device that includes p+-type anode layers and p+-type floating drain layers that are connected to the anode layers by a MOSFET 20 formed on the surface of an n--type conductivity-modulating layer. When a forward voltage is applied, holes are injected from the drain layers to create an element with a conductivity-modulated condition and realize a low on-resistance. By the time a reverse voltage is applied, the drain layers have already been separated to reduce the number of excessive carriers. Thus, the reverse recovery current is suppressed.
申请公布号 US5477077(A) 申请公布日期 1995.12.19
申请号 US19930045078 申请日期 1993.04.12
申请人 FUJI ELECTRIC CO., LTD. 发明人 KUMAGAI, NAOKI;UENO, KATSUNORI
分类号 H01L29/739;(IPC1-7):H01L27/01;H01L29/48 主分类号 H01L29/739
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