Merged memory and logic (MML) integrated circuits including built-in test circuits and methods

摘要

MML integrated circuits include a memory block and a logic block that is connected to the memory block. A test enable pad and a test results pad are also provided. The MML integrated circuit also includes a built-in self-tester that is responsive to a test enable signal on the test enable pad, to test the memory block and to provide the test results on the test results pad. A clock pad may also be provided wherein the built-in self-tester is responsive to the test enable signal on the test enable pad and to a clock signal on the clock pad. The built-in self-tester preferably tests the memory block by providing control signals to the memory block and obtaining data that is read from the memory block.