APPARATUS, SYSTEM AND METHOD FOR TESTING ELECTRONIC ELEMENTS
摘要
<p>An electronic element testing apparatus for use with a number of probes. Each probe has a lower pole and an upper pole. The apparatus includes: a first plate having a first side and a second side, the first side having an array of lower pole regions disposed thereabout, each lower pole region configured to receive a lower pole of a probe; and a plurality of signal conductor regions disposed proximate the array of lower pole regions, each signal conductor region arranged to provide a non-cable electrical path between a lower pole region and a switching circuit. The switching circuits are operable to sequentially connect each electronic element to a testing circuit via the upper and lower poles.</p>
申请公布号
WO2006104879(A2)
申请公布日期
2006.10.05
申请号
WO2006US10759
申请日期
2006.03.24
申请人
VISHAY GENERAL SEMICONDUCTOR LLC;LEE, K., R;HSU, ROI;LIN, KAVEN;WU, S., I