发明名称 PHASE SHIFT MASK
摘要 PROBLEM TO BE SOLVED: To provide a phase shift mask which is applicable to, for example, a crystallizer to control a position of a crystal core, and then can substantially control a formation region of a crystal two-dimensionally. SOLUTION: The phase shift mask comprises: a first region (11) and a second region (12) which are formed on both sides of a substantially linear boundary line (10a) and have a first phase difference; and a micro region (13) of a predetermined shape which is formed in at least either region of the first region and second region along the boundary line. A second phase difference is applied to between the first region or second region where the micro region is formed and the micro region. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009060128(A) 申请公布日期 2009.03.19
申请号 JP20080276197 申请日期 2008.10.28
申请人 ADVANCED LCD TECHNOLOGIES DEVELOPMENT CENTER CO LTD 发明人 TANIGUCHI YUKIO;MATSUMURA MASAKIYO;YAMAGUCHI HIROTAKA;NISHITANI MIKIHIKO;TSUJIKAWA SUSUMU;KIMURA YOSHINOBU;JUMONJI MASAYUKI
分类号 H01L21/268;H01L21/20;H01L21/336;H01L29/786 主分类号 H01L21/268
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