发明名称 STRUCTURAL DEFORMATION DETECTING DEVICE
摘要 A structural deformation detecting device comprises a vibration section configured to vibrate a specific vibration position on a measured structure in a non-contact manner, a first vibration measurement section configured to detect the vibration generated in the measured object from any position in a non-contact manner, a housing on which the vibration section and the vibration measurement section are arranged at a specific interval, and a time measurement section configured to measure the time elapsing till the vibration of the measured object caused by the vibration section is detected by the first vibration measurement section.
申请公布号 US2016202214(A1) 申请公布日期 2016.07.14
申请号 US201614989854 申请日期 2016.01.07
申请人 TOSHIBA TEC KABUSHIKI KAISHA 发明人 Komiya Kenichi;Ishikawa Daisuke
分类号 G01N29/07;G01N29/24 主分类号 G01N29/07
代理机构 代理人
主权项 1. A structural deformation detecting device, comprising: a vibration section configured to vibrate a specific vibration position on a structure serving as a measured object in a non-contact manner; a first vibration measurement section configured to detect the vibration generated in the measured object from any position in a non-contact manner; a housing on which the vibration section and the vibration measurement section are arranged at a specific interval; and a time measurement section configured to measure the time elapsing till the vibration of the measured object caused by the vibration section is detected by the first vibration measurement section.
地址 Tokyo JP