发明名称 |
STRUCTURAL DEFORMATION DETECTING DEVICE |
摘要 |
A structural deformation detecting device comprises a vibration section configured to vibrate a specific vibration position on a measured structure in a non-contact manner, a first vibration measurement section configured to detect the vibration generated in the measured object from any position in a non-contact manner, a housing on which the vibration section and the vibration measurement section are arranged at a specific interval, and a time measurement section configured to measure the time elapsing till the vibration of the measured object caused by the vibration section is detected by the first vibration measurement section. |
申请公布号 |
US2016202214(A1) |
申请公布日期 |
2016.07.14 |
申请号 |
US201614989854 |
申请日期 |
2016.01.07 |
申请人 |
TOSHIBA TEC KABUSHIKI KAISHA |
发明人 |
Komiya Kenichi;Ishikawa Daisuke |
分类号 |
G01N29/07;G01N29/24 |
主分类号 |
G01N29/07 |
代理机构 |
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代理人 |
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主权项 |
1. A structural deformation detecting device, comprising:
a vibration section configured to vibrate a specific vibration position on a structure serving as a measured object in a non-contact manner; a first vibration measurement section configured to detect the vibration generated in the measured object from any position in a non-contact manner; a housing on which the vibration section and the vibration measurement section are arranged at a specific interval; and a time measurement section configured to measure the time elapsing till the vibration of the measured object caused by the vibration section is detected by the first vibration measurement section. |
地址 |
Tokyo JP |