发明名称 |
METHOD FOR THE QUANTITATIVE DETERMINATION OF ELEMENTS FOR STUDYING THE DISTRIBUTION OF AIR POLLUTANTS IN THE SURROUNDINGS OF AN EMISSION SOURCE |
摘要 |
The object of the invention is a method for quantitatively determining elements for studying the distribution of air pollutants in the surroundings of an emission source. The method is characterized by the following steps: the sample to be examined is collected at a sampling plot from the plant cover surrounding the emission source, by taking the sample from a surface portion thereof, at that side of the sampling plot which faces the emission source; the sample is dried; the surface of the sample is made electrically conducting; the contents of the elements deposited on the surface of the sample are measured using an energy dispersive X-ray microanalyzer (EDX) connected to a scanning electron microscope (SEM). |
申请公布号 |
EP0950182(A1) |
申请公布日期 |
1999.10.20 |
申请号 |
EP19980900081 |
申请日期 |
1998.01.02 |
申请人 |
HELSINKI UNIVERSITY LICENSING LTD. OY |
发明人 |
HAAPALA, HEIKKI |
分类号 |
G01N23/223;(IPC1-7):G01N23/00 |
主分类号 |
G01N23/223 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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