发明名称 METHOD FOR THE QUANTITATIVE DETERMINATION OF ELEMENTS FOR STUDYING THE DISTRIBUTION OF AIR POLLUTANTS IN THE SURROUNDINGS OF AN EMISSION SOURCE
摘要 The object of the invention is a method for quantitatively determining elements for studying the distribution of air pollutants in the surroundings of an emission source. The method is characterized by the following steps: the sample to be examined is collected at a sampling plot from the plant cover surrounding the emission source, by taking the sample from a surface portion thereof, at that side of the sampling plot which faces the emission source; the sample is dried; the surface of the sample is made electrically conducting; the contents of the elements deposited on the surface of the sample are measured using an energy dispersive X-ray microanalyzer (EDX) connected to a scanning electron microscope (SEM).
申请公布号 EP0950182(A1) 申请公布日期 1999.10.20
申请号 EP19980900081 申请日期 1998.01.02
申请人 HELSINKI UNIVERSITY LICENSING LTD. OY 发明人 HAAPALA, HEIKKI
分类号 G01N23/223;(IPC1-7):G01N23/00 主分类号 G01N23/223
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