发明名称 Chemical mechanical polishing compositions and methods relating thereto
摘要 A method for chemical mechanical polishing of semiconductor substrates containing a metal layer requiring removal and metal interconnects utilizing a composition containing engineered copolymer molecules comprising hydrophilic functional groups and relatively less hydrophilic functional groups; the engineered copolymer molecules enabling contact-mediated reactions between the polishing pad surface and the substrate surface during CMP resulting in minimal dishing of the metal interconnects in the substrate.
申请公布号 US7300874(B2) 申请公布日期 2007.11.27
申请号 US20050077671 申请日期 2005.03.10
申请人 ROHM AND HAAS ELECTRONIC MATERIALS CMP HOLDINGS, INC. 发明人 WEINSTEIN BARRY;GHOSH TIRTHANKAR
分类号 B24B37/00;H01L21/302;C09G1/02;C09K3/14;H01L21/304;H01L21/321;H01L21/461 主分类号 B24B37/00
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