发明名称 Memory cell comprising non-self-aligned horizontal and vertical control gates
摘要 The present disclosure relates to a memory cell comprising a vertical selection gate extending in a trench made in a substrate, a floating gate extending above the substrate, and a horizontal control gate extending above the floating gate, wherein the floating gate also extends above a portion of the vertical selection gate over a non-zero overlap distance. Application mainly to the production of a split gate memory cell programmable by hot-electron injection.
申请公布号 US9406686(B2) 申请公布日期 2016.08.02
申请号 US201414528785 申请日期 2014.10.30
申请人 STMICROELECTRONICS (ROUSSET) SAS 发明人 La Rosa Francesco;Niel Stephan;Delalleau Julien;Regnier Arnaud
分类号 H01L27/115;H01L29/788;H01L21/28;H01L29/423;H01L29/66;G11C16/14;H01L21/3205;H01L21/3213;H01L29/78;G11C16/04 主分类号 H01L27/115
代理机构 Seed IP Law Group PLLC 代理人 Seed IP Law Group PLLC
主权项 1. A memory cell, comprising: a vertical selection gate extending in a trench made in a semiconductor substrate; a floating gate extending on the substrate; a horizontal control gate extending above the floating gate, wherein the floating gate has a protuberance which extends beneath an upper surface of the substrate; and a first dielectric layer positioned within the substrate and between the protuberance of the floating gate and the vertical selection gate.
地址 Rousset FR