发明名称 Assessment System
摘要 An assessment system, including methods of and apparatus for producing a targeted assessment scheme comprising battery of tests or assessments and based on a plurality of requirements. Methods described include a method of producing an assessment scheme for assessing the suitability of a candidate, the method comprising: receiving as input from a user at least one candidate requirement and at least one candidate test identifier; constructing a candidate assessment comprising at least one test in dependence on the test identifier; analysing the candidate assessment in dependence on the requirement to predict the accuracy of the assessment in identifying a suitable candidate; and reporting on the predicted accuracy of the candidate assessment.
申请公布号 US2016283905(A1) 申请公布日期 2016.09.29
申请号 US201415029969 申请日期 2014.10.16
申请人 LAHTI Ken;KANTROWITZ Tracy;DEKOEKKOEK Paul;MEYER Jolene;GRELLE Darrin;FACTEAU Jeff;AFFOURTIT Mathijs;MCLELLAN Richard;FLECK Steven;DAWSON Craig 发明人 Lahti Ken;Kantrowitz Tracy;Dekoekkoek Paul;Meyer Jolene;Grelle Darrin;Facteau Jeff;Affourtit Mathijs;McLellan Richard;Fleck Steven;Dawson Craig
分类号 G06Q10/10;G06F17/30 主分类号 G06Q10/10
代理机构 代理人
主权项 1. A method of producing an assessment scheme for assessing the suitability of a candidate, the method comprising: receiving as input from a user at least one candidate requirement and at least one candidate test identifier; constructing a candidate assessment comprising at least one test in dependence on the test identifier; analyzing the candidate assessment in dependence on the requirement to predict the accuracy of the assessment in identifying a suitable candidate; and reporting on the predicted accuracy of the candidate assessment.
地址 Thames Ditton, Surrey GB