发明名称 |
METHOD FOR ELIMINATING PUNCTUAL DEFECTS COMPRISED IN AN ELECTROCHEMICAL DEVICE |
摘要 |
The suppression, with the aid of a radiation laser beam, of the defects at the heart of a laminated device formed from first and second substrates incorporating an active intelligent system consists of: (a) locating at least one defect in the heart of the active system; (b) ablation of the defect consisting of circumscribing it using the laser beam. An Independent claim is also included for a window incorporating an electrochemical device. |
申请公布号 |
PL375208(A1) |
申请公布日期 |
2005.11.28 |
申请号 |
PL20030375208 |
申请日期 |
2003.10.01 |
申请人 |
SAINT-GOBAIN GLASS FRANCE |
发明人 |
BETEILLE FABIEN |
分类号 |
B23K26/16;B32B17/10;C03B32/00;G02F1/15;G02F1/153;G02F1/17;H01L21/30 |
主分类号 |
B23K26/16 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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