发明名称 METHOD FOR ELIMINATING PUNCTUAL DEFECTS COMPRISED IN AN ELECTROCHEMICAL DEVICE
摘要 The suppression, with the aid of a radiation laser beam, of the defects at the heart of a laminated device formed from first and second substrates incorporating an active intelligent system consists of: (a) locating at least one defect in the heart of the active system; (b) ablation of the defect consisting of circumscribing it using the laser beam. An Independent claim is also included for a window incorporating an electrochemical device.
申请公布号 PL375208(A1) 申请公布日期 2005.11.28
申请号 PL20030375208 申请日期 2003.10.01
申请人 SAINT-GOBAIN GLASS FRANCE 发明人 BETEILLE FABIEN
分类号 B23K26/16;B32B17/10;C03B32/00;G02F1/15;G02F1/153;G02F1/17;H01L21/30 主分类号 B23K26/16
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