| 摘要 |
A measurement device measures voltage/current characteristics of a device under test (DUT) and suppresses spikes and overshoots which appear in an output when voltage and current settings fed to the DUT are changed, and makes possible rapid setting changes. The measurement device has a V holding loop which contains a capacitor, an error amplifier, an FET switch, a voltage-current converter, an integrator, a power amplifier, a current ranging circuit and a buffer amplifier. During ordinary operation of the circuit, the FET switch is on and the output voltage is remembered by the capacitor. When the voltage-current settings are changed, the FET switch is off, the feedback circuit of the V holding loop is formed, and the value of the output voltage immediately before the changes were performed is held, on the basis of the voltage of the capacitor. During this time, the voltage and current values are changed; and when the changes are complete, the feedback circuit of the V holding loop is cut; and the circuit is returned to its normal operating state.
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