| 摘要 |
<p>PROBLEM TO BE SOLVED: To obtain a display control apparatus by which specific X-rays of an element to be observed are displayed clearly. SOLUTION: In a display control apparatus 2 for a KLM marker in an electron probe microanalyzer, an element name and the marker of its position are displayed on an analytical profile collected frpm an electron probe microanalyzer 1 or the like. The display control apparatus is provided with a marker-information table 22 which comprises position information on a marker so as to correspond to every line kind and every order for every element. Then, when an element, a line type and an order are designated by a marker designation part 4 as information used to display the marker, position information on the line type and the order of a corresponding element is read out from the marker-information table 22, and the marker is displayed in the position.</p> |
