| 摘要 |
A specimen part (10) for determining the intensity data of a measuring spot (13) in X-ray fluorescent analysis is characterised in that it has a probe (12) with a clearly defined contour surrounded by a surrounding material (11), the surrounding material (11) and the probe (12) material having the same linear attenuation coefficients for the emitted X-ray fluorescent radiation (8). With a method according to the invention it is possible to determine both the intensity centre and the contour of the measuring spot. The probe (12) and surrounding material (11) can form one sector of a four quadrant detector having a common contact edge whose position relative to the probe (12) is known. |
