发明名称 Method of supporting microelectronic wafer during backside processing
摘要 A method of supporting a microelectronic wafer during backside processing. The method comprises: selecting a rigid carrier, an adhesive, and a radiation source to emit radiation at a predetermined wavelength range; forming a wafer-carrier stack by providing the adhesive between the wafer and the carrier and curing the adhesive to bond the wafer to the carrier; subjecting the wafer in the wafer-carrier stack to backside processing; and removing the carrier and the adhesive from the wafer-carrier stack comprising detackifying the adhesive by irradiating the wafer-carrier stack from a carrier side thereof with radiation from the radiation source. The carrier is adapted to transmit therethrough at least some of the radiation from the radiation source. and the adhesive is adapted to absorb substantially all radiation transmitted through the carrier and is further adapted to be detackified as a result of absorbing said substantially all radiation.
申请公布号 US2006286768(A1) 申请公布日期 2006.12.21
申请号 US20050155751 申请日期 2005.06.16
申请人 INTEL CORPORATION 发明人 ARANA LEONEL R.;PRACK EDWARD R.;NEWMAN MICHAEL W.
分类号 H01L21/30 主分类号 H01L21/30
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