发明名称 Monitoring circuit of semiconductor device to monitor a read-period signal during activation of a boot-up enable signal
摘要 The monitoring circuit of a semiconductor device includes: a boot-up controller configured to generate a boot-up enable signal in response to a power-up signal and a boot-up command signal; a read-period generator configured to output a read-period signal in response to a boot-up read signal; and a monitoring unit configured to output the read-period signal to an external output terminal during activation of the boot-up enable signal to allow the read-period signal to be monitored.
申请公布号 US9459882(B2) 申请公布日期 2016.10.04
申请号 US201414509193 申请日期 2014.10.08
申请人 SK hynix Inc. 发明人 Lee Joo Hyeon
分类号 G06F15/177;G06F1/00;G11C17/18;G06F9/44;G01R31/317;G06F1/24 主分类号 G06F15/177
代理机构 William Park & Associates Ltd. 代理人 William Park & Associates Ltd.
主权项 1. A monitoring circuit of a semiconductor device comprising: a boot-up controller configured to generate a boot-up enable signal in response to a power-up signal and a boot-up command signal; a read-period generator configured to output a read-period signal in response to a boot-up read signal; and a monitoring unit configured to output the read-period signal to an external output terminal during activation of the boot-up enable signal to allow the read-period signal to be monitored.
地址 Icheon-si, Gyeonggi-do KR