发明名称 |
Monitoring circuit of semiconductor device to monitor a read-period signal during activation of a boot-up enable signal |
摘要 |
The monitoring circuit of a semiconductor device includes: a boot-up controller configured to generate a boot-up enable signal in response to a power-up signal and a boot-up command signal; a read-period generator configured to output a read-period signal in response to a boot-up read signal; and a monitoring unit configured to output the read-period signal to an external output terminal during activation of the boot-up enable signal to allow the read-period signal to be monitored. |
申请公布号 |
US9459882(B2) |
申请公布日期 |
2016.10.04 |
申请号 |
US201414509193 |
申请日期 |
2014.10.08 |
申请人 |
SK hynix Inc. |
发明人 |
Lee Joo Hyeon |
分类号 |
G06F15/177;G06F1/00;G11C17/18;G06F9/44;G01R31/317;G06F1/24 |
主分类号 |
G06F15/177 |
代理机构 |
William Park & Associates Ltd. |
代理人 |
William Park & Associates Ltd. |
主权项 |
1. A monitoring circuit of a semiconductor device comprising:
a boot-up controller configured to generate a boot-up enable signal in response to a power-up signal and a boot-up command signal; a read-period generator configured to output a read-period signal in response to a boot-up read signal; and a monitoring unit configured to output the read-period signal to an external output terminal during activation of the boot-up enable signal to allow the read-period signal to be monitored. |
地址 |
Icheon-si, Gyeonggi-do KR |