发明名称 Multiple testing bars for testing liquid crystal display and method thereof
摘要 A plurality of gate lines are formed on an insulating substrate in the horizontal direction, a gate shorting bar connected to the data lines is formed in the vertical direction and a gate insulating film is formed thereon. A plurality of data lines intersecting the gate lines are formed on the gate insulating film in the vertical direction, and a data shorting bar connected to the data lines is formed outside the display region. A first shorting bar is formed on the gate insulating film, located between the gate lines and the gate shorting bar, and connected to the odd gate lines. A second secondary shorting bar is formed parallel to the first shorting bar and connected to the even gate lines.
申请公布号 US6982569(B2) 申请公布日期 2006.01.03
申请号 US20030705836 申请日期 2003.11.13
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE SANG-KYOUNG;KIM DONG-GYU;MOON MIN-HYUNG
分类号 G01R31/00;G02F1/1343;G02F1/133;G02F1/1345;G02F1/136;G02F1/1362;G02F1/1368;G09F9/35;H01L21/00 主分类号 G01R31/00
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