发明名称 Semiconductor devices having an improved gate
摘要 A MOSFET comprises a silicon substrate 1 having a source/drain region 7b formed in a surface region thereof, an insulating film 3 formed of silicon oxide, and a gate electrode 4a. The side surface region of the electrode 4a is covered with an insulating film 6 formed of silicon nitride. The insulating film 6 has an extended portion interposed between the electrode 4a and the insulating film 3 in a manner to surround the lower corner portion 4b of the electrode. Since the insulating film 6 has a dielectric constant larger than that of the insulating film 3, it is possible to suppress the electric field intensity at the lower corner portion 4b of the electrode.
申请公布号 US5254867(A) 申请公布日期 1993.10.19
申请号 US19910726764 申请日期 1991.07.08
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 FUKUDA, SANAE;SHIGYO, NAOYUKI
分类号 H01L21/28;H01L29/423;H01L29/51;H01L29/78;(IPC1-7):H01L29/78;H01L29/06 主分类号 H01L21/28
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