发明名称 Semiconductor device and method of producing the same
摘要 Source and drain electrode metals of a field effect transistor having a recessed gate electrode metal are directly connected to a high impurity concentration semiconductor layer which faces the gate electrode metal through an insulator film which defines the side wall of the recess. The source and drain electrode metals may be disposed so as to face the gate electrode metal through the side insulator film. With this arrangement, it is possible to lower the parasitic resistance between the gate electrode and another electrode of the field effect transistor, to lower the contact resistance between a semiconductor layer and the source and drain electrodes, to reduce the capacitance of the recess gate electrode and to increase the source-gate breakdown voltage, advantageously. The above-described arrangement is particularly suitable for a transistor employing a compound semiconductor, and can also be applied to semiconductor devices other than field effect transistors. Such semiconductor devices can readily be produced by forming a gate electrode metal with a self-alignment process using the lift-off method.
申请公布号 US5373191(A) 申请公布日期 1994.12.13
申请号 US19920998856 申请日期 1992.12.30
申请人 HITACHI LTD. 发明人 USAGAWA, TOSHIYUKI;IMAMURA, YOSHINORI;OKUHIRA, HIDEKAZU;GOTO, SHIGEO;KOBAYASHI, MASAYOSHI;TAKATANI, SHINICHIRO
分类号 H01L21/285;H01L21/331;H01L21/335;H01L21/337;H01L21/338;H01L21/60;H01L21/8252;H01L23/485;H01L29/812;(IPC1-7):H01L29/80;H01L29/48;H01L29/06;H01L23/48 主分类号 H01L21/285
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