发明名称 EXPOSURE CHARACTERISTIC INSPECTION METHOD FOR EXPOSURE DEVICE AND EXPOSURE DEVICE
摘要 PROBLEM TO BE SOLVED: To inspect a line exposure means whose width is wider than that of photographic paper by using the photographic paper to be normally used by utilizing a sorting function. SOLUTION: An inspecting condition for distributing the photographic paper P whose width is 89 cm to four columns is decided by switching a mode to the inspection operating mode. A 1st column is distributed to a position being 92.5 mm inside from the center and a 2nd column is distributed to a position being 30.5 mm inside. A 3rd column is distributed to a position being 30.5 mm front side from the center and a 4th column is distributed to a position being 92.5 mm front side from the center. By exposing the paper 6 by distributing it in such a way, the characteristic of an exposure element at the part of 274 mm inside the whole width of a PLZT head 61 is inspected.
申请公布号 JP2000356831(A) 申请公布日期 2000.12.26
申请号 JP19990168642 申请日期 1999.06.15
申请人 NORITSU KOKI CO LTD 发明人 MIYAWAKI HIROSHI
分类号 G03B27/46;G03B27/72;(IPC1-7):G03B27/72 主分类号 G03B27/46
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