发明名称 Bi-layer approach for a hermetic low dielectric constant layer for barrier applications
摘要 Methods and apparatus are provided for processing a substrate with a bilayer barrier layer. In one aspect, the invention provides a method for processing a substrate including depositing a nitrogen containing barrier layer on a substrate surface and then depositing a nitrogen free barrier layer thereon. The barrier layer may be deposited over dielectric materials, conductive materials, or both. The bilayer barrier layer may also be used as an etch stop, an anti-reflective coating, or a passivation layer.
申请公布号 US2005042889(A1) 申请公布日期 2005.02.24
申请号 US20040888110 申请日期 2004.07.09
申请人 发明人 LEE ALBERT;LAKSHMANAN ANNAMALAI;KIM BOK HOEN;XIA LI-QUN;SHEK MEI-YEE
分类号 C23C16/30;C23C16/40;C23C16/56;H01L21/311;H01L21/312;H01L21/316;H01L21/768;(IPC1-7):H01L21/31;H01L21/469;H01L21/336 主分类号 C23C16/30
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