发明名称 Method and apparatus for sensing in charge trapping non-volatile memory
摘要 A memory cell with a charge trapping structure is read by measuring current between the substrate region of the memory cell and one of the source region of the memory cell and the drain region of the memory cell. The read operation decreases the coupling between different parts of the charge trapping structure when other parts of the charge trapping structure store data that are not of interest. The sensing window of the memory cell can be greatly improved by this read operation.
申请公布号 US7483307(B2) 申请公布日期 2009.01.27
申请号 US20080020793 申请日期 2008.01.28
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 YEH CHIH CHIEH
分类号 G11C16/06;G11C11/34;G11C16/04;G11C16/26 主分类号 G11C16/06
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