DETECTING COUNTERFEIT ELECTRONIC COMPONENTS USING EMI TELEMETRIC FINGERPRINTS
摘要
<p>One embodiment of the present invention provides a system that non-intrusively detects counterfeit components in a target computer system. During operation, the system collects target electromagnetic interference (EMI) signals generated by the target computer system using one or more antennas positioned in close proximity to the target computer system. The system then generates a target EMI fingerprint for the target computer system from the target EMI signals. Next, the system compares the target EMI fingerprint against a reference EMI fingerprint to determine whether the target computer system contains a counterfeit component.</p>
申请公布号
WO2009051885(A1)
申请公布日期
2009.04.23
申请号
WO2008US72920
申请日期
2008.08.12
申请人
SUN MICROSYSTEMS, INC.;GROSS, KENNY C.;DHANEKULA, RAMAKRISHNA C.;LEWIS, ANDREW J.
发明人
GROSS, KENNY C.;DHANEKULA, RAMAKRISHNA C.;LEWIS, ANDREW J.