| 摘要 |
PROBLEM TO BE SOLVED: To provide a method for estimating a threshold voltage in a thin-film transistor of a thin-film transistor substrate (TFT substrate) without increasing steps of manufacturing the TFT substrate.SOLUTION: A method for estimating a threshold voltage in a thin-film transistor of a TFT substrate includes the steps of: receiving power by a power-receiving sensor in the other end of each of a plurality of wirings while applying voltage to one end of each of the plurality of wirings, and measuring the current flowing through the power-receiving sensor (step S12); and estimating a threshold voltage on the basis of the predetermined relationship between the current and the threshold voltage (step S13). The TFT substrate comprises a substrate, a thin-film transistor arranged on the substrate, and a plurality of wirings (data lines) arranged on the substrate. The plurality of wirings are electrically connected each other through a drain-to-source path of the thin-film transistor.SELECTED DRAWING: Figure 12 |
