Test probe coated with conductive elastomer for testing of backdrilled plated through holes in printed circuit board assembly

摘要

A test probe is provided for probing signal information on a back-drilled plated through hole connector formed in a printed circuit board, where the test probe includes a conductive probe body with a distal tip region extending a predetermined minimum coverage length (LTIP) that is longer than a recess depth dimension (DPL) for a recessed plating layer formed in the back-drilled plated through hole connector with an elastomer test probe tip formed around the distal tip region and having a total tip width (WTIP) which is compressed when inserted into the recessed plating layer formed in a back-drilled plated through hole connector, thereby establishing a conductive path between the conductive probe body and the recessed plating layer.

主权项

1. An electrical device for probing signal information on a back-drilled plated through hole connector formed in a printed circuit board, the electrical device comprising:
a conductive probe body comprising a distal tip region extending a predetermined minimum coverage length (LTIP) that is controlled to be longer than a recess depth dimension (DPL) for a recessed plating layer formed in a back-drilled plated through hole connector to be probed; and an elastomer test probe tip formed annularly around the distal tip region of the conductive probe body and having a total tip width (WTIP) that is wider than a width of the conductive probe body and controlled to be compressed when the distal tip region of the conductive probe body is inserted into the recessed plating layer formed in a back-drilled plated through hole connector to be probed so as to establish a conductive path between the conductive probe body and the recessed plating layer.