发明名称 Methods and apparatus to detect a presence of a conductive object
摘要 A method and apparatus determine a plurality of regions, each of the plurality of regions having a detected change in capacitance value that meets or exceeds a threshold value. In an embodiment, the method and apparatus fit a shape to the plurality of regions and determine another region, the other region being within the fitted shape and not having the detected change in capacitance value that meets or exceeds the threshold value. The method and apparatus may assign an assigned change in capacitance value to the other region.
申请公布号 US9501168(B2) 申请公布日期 2016.11.22
申请号 US201113341857 申请日期 2011.12.30
申请人 Cypress Semiconductor Corporation 发明人 Peterson Jonathan R.;Wilson Cole;Fuller Thomas;Valleroy Derek
分类号 G06F3/041;G01R27/26;G06F3/044 主分类号 G06F3/041
代理机构 代理人
主权项 1. A method comprising: determining a plurality of regions, each of the plurality of regions having a detected change in capacitance value that meets or exceeds a threshold value; selecting a shape, of a plurality of shapes stored in a memory, which is a best fit to the plurality of regions, out of the plurality of shapes; fitting the shape to the plurality of regions to provide a fitted shape; after fitting the shape to the plurality of regions, determining another region, the other region being within the fitted shape and not having the detected change in capacitance value that meets or exceeds the threshold value; assigning an assigned change in capacitance value to the other region, wherein the assigned change in capacitance value is based on the detected change in capacitance value of at least one neighboring region; and calculating a centroid of the fitted shape using at least a portion of the detected changes in capacitance and the assigned change in capacitance.
地址 San Jose CA US