发明名称 Projection exposure apparatus for microlithography for the production of semiconductor components
摘要 A projection exposure apparatus for microlithography for the production of semiconductor components includes at least one optical assembly with at least one optical element which can be actuated in a mechanically controlled manner is mounted in a structure. For carrying out the mechanical actuation, a control signal transmission device and/or an energy transmission device are/is provided, which introduce(s) no parasitic mechanical effects into the optical assembly at least during specific operating states of the projection exposure apparatus.
申请公布号 US9513562(B2) 申请公布日期 2016.12.06
申请号 US201414499790 申请日期 2014.09.29
申请人 Carl Zeiss SMT GmbH 发明人 Fischer Juergen;Schoeppach Armin;Orth Matthias;Muehlberger Norbert;Rassel Thorsten;Werber Armin;Huber Juergen
分类号 G02B7/182;G03B27/32;G03B27/54;G03F7/20 主分类号 G02B7/182
代理机构 Fish & Richardson P.C. 代理人 Fish & Richardson P.C.
主权项 1. An apparatus, comprising: an optical assembly comprising: an optical element;an actuator configured to mechanically actuate the optical element;a sensor configured to sense the optical element; anda first device integrated with the optical assembly; and a second device selected from the group consisting of a device configured to provide control signals to the sensor, a device configured to transmit energy to the sensor in a contactless manner, and combinations thereof, wherein: the first device is configured to actuate the optical element via the actuator independently of the second device;the second device is configured to introduce no parasitic mechanical effects into the optical assembly at least during specific operating states of the apparatus; andthe apparatus is a microlithography projection objective.
地址 Oberkochen DE