发明名称 |
Projection exposure apparatus for microlithography for the production of semiconductor components |
摘要 |
A projection exposure apparatus for microlithography for the production of semiconductor components includes at least one optical assembly with at least one optical element which can be actuated in a mechanically controlled manner is mounted in a structure. For carrying out the mechanical actuation, a control signal transmission device and/or an energy transmission device are/is provided, which introduce(s) no parasitic mechanical effects into the optical assembly at least during specific operating states of the projection exposure apparatus. |
申请公布号 |
US9513562(B2) |
申请公布日期 |
2016.12.06 |
申请号 |
US201414499790 |
申请日期 |
2014.09.29 |
申请人 |
Carl Zeiss SMT GmbH |
发明人 |
Fischer Juergen;Schoeppach Armin;Orth Matthias;Muehlberger Norbert;Rassel Thorsten;Werber Armin;Huber Juergen |
分类号 |
G02B7/182;G03B27/32;G03B27/54;G03F7/20 |
主分类号 |
G02B7/182 |
代理机构 |
Fish & Richardson P.C. |
代理人 |
Fish & Richardson P.C. |
主权项 |
1. An apparatus, comprising:
an optical assembly comprising:
an optical element;an actuator configured to mechanically actuate the optical element;a sensor configured to sense the optical element; anda first device integrated with the optical assembly; and a second device selected from the group consisting of a device configured to provide control signals to the sensor, a device configured to transmit energy to the sensor in a contactless manner, and combinations thereof, wherein:
the first device is configured to actuate the optical element via the actuator independently of the second device;the second device is configured to introduce no parasitic mechanical effects into the optical assembly at least during specific operating states of the apparatus; andthe apparatus is a microlithography projection objective. |
地址 |
Oberkochen DE |