发明名称 Semiconductor device and method of fabricating the same
摘要 A semiconductor device includes a gate electrode on a semiconductor substrate, a source electrode and a drain electrode that are provided on the semiconductor substrate, the gate electrode being interposed between the source electrode and the drain electrode, an insulating layer covering the gate electrode, and a source wall that extends from the source electrode and passes over the gate electrode, an end surface of the source wall being interposed between the gate electrode and the drain electrode and being located in a position lower than a top surface of the gate electrode.
申请公布号 US6998679(B2) 申请公布日期 2006.02.14
申请号 US20030348779 申请日期 2003.01.23
申请人 FUJITSU QUANTUM DEVICES LIMITED 发明人 INOUE KAZUTAKA;HAEMATSU HITOSHI
分类号 H01L29/812;H01L21/338;H01L29/06;H01L29/40;H01L29/417 主分类号 H01L29/812
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