发明名称 Method of fabricating an integrated circuit for providing low-noise and high-power microwave operation
摘要 Generally, and in one form of the invention, an integrated circuit is disclosed for providing low-noise and high-power microwave operation comprising: an epitaxial material structure comprising a substrate 10, a low-noise channel layer 14, a low-noise buffer layer 16, a power channel layer 18, and a moderately doped wide bandgap layer 20; a first active region 24 comprising a first source contact 32 above the wide bandgap layer 22, a first drain contact 36 above the wide bandgap layer 22, wherein the first source contact 32 and the first drain contact 36 are alloyed and thereby driven into the material structure to make contact with the low-noise channel layer 14, and a first gate contact 28 to the low-noise buffer layer 16; and a second active region 26 comprising a second source contact 34 above the wide bandgap layer 22, a second drain contact 38 above the wide bandgap layer 22, wherein the second source contact 34 and the second drain contact 38 are alloyed and thereby driven into the material structure to make contact with the power channel layer 18, and a second gate contact 30 to the wide bandgap layer 22; wherein the first active region 24 and the second active region 26 are electrically isolated from one another, and whereby the integrated circuit is formed with all epitaxial layers formed during a single epitaxial growth cycle and is capable of providing low-noise, high-power, and switching operation at microwave frequencies.
申请公布号 US5254492(A) 申请公布日期 1993.10.19
申请号 US19920973906 申请日期 1992.11.10
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 TSERNG, HUA Q.;SAUNIER, PAUL
分类号 H01L21/8252;H01L21/8254;H01L27/06;H01L27/095;(IPC1-7):H01L21/70 主分类号 H01L21/8252
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