发明名称 MANUFACTURE OF PLASTIC PACKAGE FOR ELECTRONIC PART
摘要 PROBLEM TO BE SOLVED: To reduce quality deterioration by curing and developing a thin and a thick resist portion while exposing them through an exposing mask arranged above them, and then by subjecting the cured portions to a curing process, thereby obtaining resist-formed conductor pattern regions and hence forming solder resists on a thin and a thick portion of the resist-formed conductor pattern regions. SOLUTION: A thin resin layer 37 is formed on both regions A and B by printing a photo-curing resin for forming solder resists. The region A has a conductor pattern 33 for wire bonding, and the region B a conductor pattern 34 for ball pads. A thickening resin layer 38 is formed on the layer 37 that extends over the region B, thereby forming a thick resin layer 39. Successively, the layers 37 and 39 are exposed collectively at the same time using an exposing mask 40, thereby forming resin-cured portions 41. The layers 37 and 39 having the portions 41 are developed and cured, thereby forming a thin solder resist 35 and a thick solder resist 36.
申请公布号 JPH11233547(A) 申请公布日期 1999.08.27
申请号 JP19980044655 申请日期 1998.02.10
申请人 SUMITOMO METAL ELECTRONICS DEVICES INC 发明人 TAKAMICHI HIROSHI
分类号 H01L21/60;H05K3/34;(IPC1-7):H01L21/60 主分类号 H01L21/60
代理机构 代理人
主权项
地址