发明名称 Synchronous burst semiconductor memory device
摘要 <p>A synchronous burst semiconductor memory device (300) with a pipelined multi-bit prefetch architecture includes separate intemal address generators (310,314) for respective read and write burst modes. The synchronous memory device (300) also adopts an auto-tracking bit line scheme to reduce core cycle time, a shortened main data line for current reduction, a noise immune circuit having high-speed transfer characteristics through a dual-rail reset dynamic circuit, and strobe clocks synchronized with the output data to guarantee processor data-validation time. &lt;IMAGE&gt;</p>
申请公布号 EP0978842(A1) 申请公布日期 2000.02.09
申请号 EP19990301425 申请日期 1999.02.25
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, SU-CHUL;PARK, HEE-CHOUL
分类号 G11C7/10;G11C7/22;(IPC1-7):G11C7/00 主分类号 G11C7/10
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