发明名称 Semiconductor memory device capable of changing ECC code length
摘要 The data memory cell array and parity memory cell array in the memory cell array has a constitution that is capable of corresponding with a plurality of ECC code lengths. An input-side parity generation circuit that generates parities from write data, an output-side parity generation circuit that generates parities from read data, and a syndrome generation circuit that generates a syndrome bit that indicates an error bit from the read parity bits and generated parity bits are constituted so as to be capable of switching, according to the plurality of ECC code lengths.
申请公布号 US2008034270(A1) 申请公布日期 2008.02.07
申请号 US20070878867 申请日期 2007.07.27
申请人 FUJITSU LIMITED 发明人 ONISHI YASUHIRO;MIYO TOSHIYA
分类号 G06F11/10 主分类号 G06F11/10
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