| 摘要 |
PROBLEM TO BE SOLVED: To provide a circuit and method for outputting temperature data of a semiconductor memory apparatus, which substantially perfectly removes an output error. SOLUTION: The circuit for outputting temperature data of the semiconductor memory apparatus includes: a temperature detecting circuit that generates and outputs a temperature voltage corresponding to a change in temperature; an A/D converter that converts the temperature voltage into a first temperature code and outputs it; and a temperature data correcting unit that outputs a second temperature code obtained by correcting an error of the first temperature code using a correction code. Thus, the circuit can output temperature data from which the output error is perfectly removed since the output error in a large extent is removed by a primary correction of an analog voltage and then the output error in a fine extent is removed by a secondary correction of the temperature code. The work of primary correction of the analog voltage and the secondary correction of the temperature code are automatically performed by a test mode, the correcting work is so much simplified since the repetitive output monitoring work is unnecessary, and then the working period is reduced. COPYRIGHT: (C)2008,JPO&INPIT |
